@article{sunday2015,
author = {Sunday, Daniel and List, Scott and Chawla, Jasmeet and Kline, R.},
year = {2015},
month = {10},
pages = {},
title = {Determining the shape and periodicity of nanostructures using small-angle X-ray scattering},
volume = {48},
journal = {Journal of Applied Crystallography},
doi = {10.1107/S1600576715013369}
}


@article{sunday2016mcmc,
title={Evaluation of the effect of data quality on the profile uncertainty of critical dimension small angle x-ray scattering},
author={Sunday, Daniel F and List, Scott and Chawla, Jasmeet S and Kline, R Joseph},
journal={Journal of Micro/Nanolithography, MEMS, and MOEMS},
volume={15},
number={1},
pages={014001},
year={2016},
doi={10.1117/1.JMM.15.1.014001},
}

@article{hannon2016advancing,
title={Advancing X-ray scattering metrology using inverse genetic algorithms},
author={Hannon, Adam F and Sunday, Daniel F and Windover, Donald and Kline, R Joseph},
journal={Journal of micro/nanolithography, MEMS, and MOEMS : JM3},
volume={15},
number={3},
pages={034001},
year={2016},
doi={10.1117/1.JMM.15.3.034001},
}